df8a6.8fk 2004-03-11 1 toshiba diodes for protecting against esd epitaxial planar type df8a6.8fk diodes for protecting against esd because seven devices are mounted on an ultra compact package, it is possible to allow reducing the number of the parts and the mounting cost. zener voltage correspond to e24 series. maximum ratings (ta = 25c) characteristic symbol rating unit power dissipation p 200 mw junction temperature t j 150 c storage temperature range t stg ? 55~150 c electrical characteristics (ta = 25c) characteristic symbol test circuit test condition min typ. max unit zener voltage v z D i z = 5ma 6.4 6.8 7.2 v dynamic impedance z z D i z = 5ma D D 25 ? reverse current i r D v r = 5v D D 0.5 a total capacitance c t D v r = 0v, f=1mhz D 45 ? pf guaranteed level of esd immunity test condition esd immunity level iec61000-4-2 (contact discharge) 30kv judgment contents : no element destruction marking equivalent circuit (top view) jedec D jeita D toshiba D weight: 0.0088 g(typ.) unit in mm 8a 68 1 2 3 4 5 6 7 8 1. cathode1 2. cathode2 3. cathode3 4. cathode4 us8 2.30.1 3.10.1 0.5 2.0 0.1 1 4 0.70.1 0~0.1 0.12 0.04 5 8 0.2 +0.1 -0.05 5. cathode5 6. cathode6 7. cathode7 8. anode
df8a6.8fk 2004-03-11 2 ct - vr 10 100 02468 ta=25c f=1mhz total capacitance ct (pf) reverse voltage vr (v)
df8a6.8fk 2004-03-11 3 ? the information contained herein is subject to change without notice. ? the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba for any infringements of patents or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any patent or patent rights of toshiba or others. ? toshiba is continually working to im prove the quality and reliability of its pr oducts. nevertheless, semiconductor devices in general can malfunction or fa il due to their inherent electrical se nsitivity and vulner ability to physical stress. it is the responsibility of the buyer, when utiliz ing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. ? the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunct ion or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. ? toshiba products should not be embedded to the downstream products which are prohibited to be produced and sold, under any law and regulations. 030619eaa restrictions on product use
|
